128 search results - page 26 / 26 » Microprocessor Based Testing for Core-Based System on Chip |
HPCA
2006
IEEE
14 years 5 months ago
2006
IEEE
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...
MTDT
2003
IEEE
13 years 10 months ago
2003
IEEE
Advances in System-on-Chip (SoC) technology rely on manufacturing and assembling high-performance system cores for many critical applications. Among these cores, memory occupies t...
ISCA
2008
IEEE
13 years 11 months ago
2008
IEEE
As CMOS technology scales and more transistors are packed on to the same chip, soft error reliability has become an increasingly important design issue for processors. Prior resea...