2 search results - page 1 / 1 » Mitigation of intra-array SRAM variability using adaptive vo... |
ICCAD
2009
IEEE
13 years 2 months ago
2009
IEEE
SRAM cell design is driven by the need to satisfy static noise margin, write margin and read current margin (RCM) over all cells in the array in an energy-efficient manner. These ...
ICCD
2008
IEEE
13 years 11 months ago
2008
IEEE
— SRAMs typically represent half of the area and more than half of the transistors on a chip today. Variability increases as feature size decreases, and the impact of variability...