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KDD
2000
ACM
211views Data Mining» more  KDD 2000»
13 years 9 months ago
Mining IC test data to optimize VLSI testing
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
Tony Fountain, Thomas G. Dietterich, Bill Sudyka
IANDC
2011
129views more  IANDC 2011»
13 years 8 days ago
Rigid tree automata and applications
We introduce the class of Rigid Tree Automata (RTA), an extension of standard bottom-up automata on ranked trees with distinguished states called rigid. Rigid states define a res...
Florent Jacquemard, Francis Klay, Camille Vacher