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KDD
2000
ACM
211views Data Mining» more  KDD 2000»
13 years 9 months ago
Mining IC test data to optimize VLSI testing
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
Tony Fountain, Thomas G. Dietterich, Bill Sudyka
IANDC
2011
129views more  IANDC 2011»
13 years 22 days ago
Rigid tree automata and applications
We introduce the class of Rigid Tree Automata (RTA), an extension of standard bottom-up automata on ranked trees with distinguished states called rigid. Rigid states define a res...
Florent Jacquemard, Francis Klay, Camille Vacher