2 search results - page 1 / 1 » Model-Based 2.5-D Deconvolution for Extended Depth of Field ... |
TIP
2008
13 years 4 months ago
2008
Abstract--Due to the limited depth of field of brightfield microscopes, it is usually impossible to image thick specimens entirely in focus. By optically sectioning the specimen, t...
ISBI
2006
IEEE
14 years 5 months ago
2006
IEEE
Brightfield microscopy often suffers from limited depth of field, which prevents thick specimens from being imaged entirely in-focus. By optically sectioning the specimen, the inf...