2 search results - page 1 / 1 » Modeling of NBTI-Induced PMOS Degradation under Arbitrary Dy... |
ISQED
2008
IEEE
13 years 10 months ago
2008
IEEE
Negative bias temperature instability (NBTI) is one of the primary limiters of reliability lifetime in nano-scale integrated circuits. NBTI manifests itself in a gradual increase ...
ISQED
2007
IEEE
13 years 10 months ago
2007
IEEE
Negative bias temperature instability (NBTI) has come to the forefront of critical reliability phenomena in advanced CMOS technology. In this paper, we propose a fast and accurate...