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VLSID
2006
IEEE
129views VLSI» more  VLSID 2006»
14 years 5 months ago
Modeling and Reduction of Gate Leakage during Behavioral Synthesis of NanoCMOS Circuits
For a nanoCMOS of sub-65nm technology, where the gate oxide (SiO2) thickness is very low, the gate leakage is one of the major components of power dissipation. In this paper, we pr...
Saraju P. Mohanty, Elias Kougianos
DAC
2006
ACM
14 years 6 months ago
Standard cell characterization considering lithography induced variations
As VLSI technology scales toward 65nm and beyond, both timing and power performance of integrated circuits are increasingly affected by process variations. In practice, people oft...
Ke Cao, Sorin Dobre, Jiang Hu
AAAI
2006
13 years 6 months ago
When Gossip is Good: Distributed Probabilistic Inference for Detection of Slow Network Intrusions
Intrusion attempts due to self-propagating code are becoming an increasingly urgent problem, in part due to the homogeneous makeup of the internet. Recent advances in anomalybased...
Denver Dash, Branislav Kveton, John Mark Agosta, E...