3 search results - page 1 / 1 » Modular Operational Test Plans for Inferences on Software Re... |
TSE
2002
13 years 4 months ago
2002
DATE
2006
IEEE
13 years 11 months ago
2006
IEEE
Today’s nanometer technology trends have a very negative impact on the reliability of semiconductor products. Intermittent faults constitute the largest part of reliability fail...
SAC
2005
ACM
13 years 10 months ago
2005
ACM
This paper describes the use of fault tolerance in a multiagent system. Such an approach is based on the modeling of autonomous agents with planning capabilities. These capabiliti...