150 search results - page 3 / 30 » Multi-Level Test Models for Embedded Systems |
ACSAC
2003
IEEE
13 years 10 months ago
2003
IEEE
1 DOD Joint Vision 2020 (JV2020) is the integrated multi-service planning document for conduct among coalition forces of future warfare. It requires the confluence of a number of k...
ICSE
2011
IEEE-ACM
12 years 8 months ago
2011
IEEE-ACM
—Dynamic reconfiguration – the ability to hot swap a component, or to introduce a new component into the system – is essential to supporting evolutionary change in long-live ...
ETS
2007
IEEE
13 years 11 months ago
2007
IEEE
This paper summarizes advanced test patterns designed to target dynamic and time-related faults caused by new defect mechanisms in deep-submicron memory technologies. Such tests a...
EMSOFT
2005
Springer
13 years 10 months ago
2005
Springer
UPPAAL-TRON is a new tool for model based online black-box conformance testing of real-time embedded systems specified as timed automata. In this paper we present our experiences...
DATE
2006
IEEE
13 years 11 months ago
2006
IEEE
Today’s nanometer technology trends have a very negative impact on the reliability of semiconductor products. Intermittent faults constitute the largest part of reliability fail...