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» Multiplicative synopses for relative-error metrics
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EDBT
2009
ACM
133views Database» more  EDBT 2009»
13 years 11 months ago
Multiplicative synopses for relative-error metrics
Existing hierarchical summarization techniques fail to provide synopses good in terms of relative-error metrics. This paper introduces multiplicative synopses: a summarization par...
Panagiotis Karras
PODS
2004
ACM
148views Database» more  PODS 2004»
14 years 5 months ago
Deterministic Wavelet Thresholding for Maximum-Error Metrics
Several studies have demonstrated the effectiveness of the wavelet decomposition as a tool for reducing large amounts of data down to compact wavelet synopses that can be used to ...
Minos N. Garofalakis, Amit Kumar
SSDBM
2005
IEEE
148views Database» more  SSDBM 2005»
13 years 10 months ago
A Fast Approximation Scheme for Probabilistic Wavelet Synopses
Several studies have demonstrated the effectiveness of Haar wavelets in reducing large amounts of data down to compact wavelet synopses that can be used to obtain fast, accurate a...
Antonios Deligiannakis, Minos N. Garofalakis, Nick...
CLEAR
2007
Springer
144views Biometrics» more  CLEAR 2007»
13 years 11 months ago
The SRI-ICSI Spring 2007 Meeting and Lecture Recognition System
We describe the latest version of the SRI-ICSI meeting and lecture recognition system, as was used in the NIST RT-07 evaluations, highlighting improvements made over the last year....
Andreas Stolcke, Xavier Anguera, Kofi Boakye, &Oum...