17 search results - page 4 / 4 » NBTI tolerant microarchitecture design in the presence of pr... |
HPCA
2006
IEEE
14 years 5 months ago
2006
IEEE
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...
SIGMOD
2008
ACM
14 years 5 months ago
2008
ACM
We study the problem of querying relational data embedded in XML. Relational data can be represented by various tree structures in XML. However, current XML query methods, such as...