Both the number of embedded memories, as well as the total embedded memory content in our chips is growing steadily. Time for chip designers, EDA makers, and test engineers to upd...
Erik Jan Marinissen, Betty Prince, Doris Keitel-Sc...
Within two or three technology generations, processor architects will face a number of major challenges. Wire delays will become critical, and power considerations will temper the ...
Single-event upsets from particle strikes have become a key challenge in microprocessor design. Techniques to deal with these transient faults exist, but come at a cost. Designers...
Shubhendu S. Mukherjee, Christopher T. Weaver, Joe...
Power density continues to increase exponentially with each new technology generation, posing a major challenge for thermal management in modern processors. Much past work has exa...