33 search results - page 7 / 7 » Noise Macromodel for Radio Frequency Integrated Circuits |
ICC
2007
IEEE
13 years 9 months ago
2007
IEEE
With the advance of semiconductor manufacturing, There are many approaches to deal with these problems. EDA, and VLSI design technologies, circuits with even higher Adding discrete...
JCP
2006
13 years 5 months ago
2006
Abstract-- In this paper a novel pulse sequence testing methodology is presented [22] as an alternative to Time Domain Reflectometry (TDR) for transmission line health condition mo...
ISLPED
2004
ACM
13 years 11 months ago
2004
ACM
We present a novel temperature/leakage sensor, developed for high-speed, low-power, monitoring of processors and complex VLSI chips. The innovative idea is the use of 4T SRAM cell...