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CP
2009
Springer
14 years 6 months ago
Constraint-Based Optimal Testing Using DNNF Graphs
The goal of testing is to distinguish between a number of hypotheses about a systemfor example, dierent diagnoses of faults by applying input patterns and verifying or falsifying t...
Anika Schumann, Martin Sachenbacher, Jinbo Huang
VLSID
2001
IEEE
164views VLSI» more  VLSID 2001»
14 years 5 months ago
An Efficient Parallel Transparent Bist Method For Multiple Embedded Memory Buffers
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
Der-Cheng Huang, Wen-Ben Jone, Sunil R. Das