23 search results - page 1 / 5 » Nonlinear transient computation and variable noise tolerance |
ESANN
2006
13 years 6 months ago
2006
A novel nonlinear transient computation device is presented which is designed to perform computations on multiple spike-train input signals. The input signals perturb the internal ...
PAMI
2006
13 years 4 months ago
2006
In an errors-in-variables (EIV) model, all the measurements are corrupted by noise. The class of EIV models with constraints separable into the product of two nonlinear functions, ...
DAC
1998
ACM
13 years 9 months ago
1998
ACM
This paper presents a general method for computing transient sensitivities using the adjoint method in event driven simulation algorithms that employ piecewise linear device model...
CVPR
2000
IEEE
14 years 6 months ago
2000
IEEE
The Errors-in-Variables (EIV) model from statistics is often employed in computer vision thoughonlyrarely under this name. In an EIV model all the measurements are corrupted by no...
ISTCS
1997
Springer
13 years 8 months ago
1997
Springer
Kearns introduced the "statistical query" (SQ) model as a general method for producing learning algorithms which are robust against classification noise. We extend this ...