82 search results - page 1 / 17 » On Structural vs. Functional Testing for Delay Faults |
ISQED
2003
IEEE
13 years 9 months ago
2003
IEEE
A structurally testable delay fault might become untestable in the functional mode of the circuit due to logic or timing constraints or both. Experimental data suggests that there...
DATE
2006
IEEE
13 years 10 months ago
2006
IEEE
We present an approach to prevent overtesting in scan-based delay test. The test data is transformed with respect to functional constraints while simultaneously keeping as many po...
ICCAD
2006
IEEE
14 years 1 months ago
2006
IEEE
It has been shown that the delay of a target path can be composed linearly of other path delays. If the later paths are robustly testable (with known delay values), the target pat...
DSD
2006
IEEE
13 years 10 months ago
2006
IEEE
Testing of high density SoCs operating at high clock speeds is an important but difficult problem. Many faults, like delay faults, in such sub-micron chips may only appear when th...
ASPDAC
2005
ACM
13 years 6 months ago
2005
ACM
Recent research results have shown that the traditional structural testing for delay and crosstalk faults may result in over-testing due to the non-trivial number of such faults t...