33 search results - page 1 / 7 » On reliable modular testing with vulnerable test access mech... |
DAC
2008
ACM
14 years 5 months ago
2008
ACM
In modular testing of system-on-a-chip (SoC), test access mechanisms (TAMs) are used to transport test data between the input/output pins of the SoC and the cores under test. Prio...
DATE
2008
IEEE
13 years 10 months ago
2008
IEEE
Existing work on testing NoC-based systems advocates to reuse the on-chip network itself as test access mechanism (TAM) to transport test data to/from embedded cores. While this m...
ISSTA
2010
ACM
13 years 8 months ago
2010
ACM
Dynamic loading of software components (e.g., libraries or modules) is a widely used mechanism for improved system modularity and flexibility. Correct component resolution is cri...
DATE
2004
IEEE
13 years 8 months ago
2004
IEEE
The increasing complexity of system-on-chip (SOC) integrated circuits has spurred the development of versatile automatic test equipment (ATE) that can simultaneously drive differe...
SBCCI
2004
ACM
13 years 9 months ago
2004
ACM
This paper proposes a test planning method capable of reusing available processors as test sources and sinks, and the on-chip network as the access mechanism for the test of cores...