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    FMSD
    2010
    123views more  FMSD 2010»
    Analog property checkers: a DDR2 case study
    13 years 3 months ago
    Analog property checkers: a DDR2 case study
    Download  www.em.informatik.uni-frankfurt.de
    Abstract Modeling and Simulation Aided Verification of Analog/MixedSignal Circuits S. Little and C. Myers (University of Utah, USA) Monday, July 14, 14:00-17:00 4 14:00-14:40 fSpic...
    Kevin D. Jones, Victor Konrad, Dejan Nickovic
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    FMSD
    2010
    118views more  FMSD 2010»
    On simulation-based probabilistic model checking of mixed-analog circuits
    13 years 3 months ago
    On simulation-based probabilistic model checking of mixed-analog circuits
    Download  www-verimag.imag.fr
    In this paper, we consider verifying properties of mixed-signal circuits, i.e., circuits for which there is an interaction between analog (continuous) and digital (discrete) values...
    Edmund M. Clarke, Alexandre Donzé, Axel Leg...
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    SAC
    2006
    ACM
    114views Applied Computing» more  SAC 2006»
    Interval-based robust statistical techniques for non-negative convex functions, with application to timing analysis of computer
    13 years 10 months ago
    Interval-based robust statistical techniques for non-negative convex functions, with application to timing analysis of computer
    Download  www.gtsav.gatech.edu
    : In chip design, one of the main objectives is to decrease its clock cycle; however, the existing approaches to timing analysis under uncertainty are based on fundamentally restri...
    Michael Orshansky, Wei-Shen Wang, Martine Ceberio,...
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    DAC
    2006
    ACM
    163views Computer Architecture» more  DAC 2006»
    Statistical timing based on incomplete probabilistic descriptions of parameter uncertainty
    14 years 5 months ago
    Statistical timing based on incomplete probabilistic descriptions of parameter uncertainty
    Download  homepages.cae.wisc.edu
    Existing approaches to timing analysis under uncertainty are based on restrictive assumptions. Statistical STA techniques assume that the full probabilistic distribution of parame...
    Wei-Shen Wang, Vladik Kreinovich, Michael Orshansk...
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    KDD
    2000
    ACM
    211views Data Mining» more  KDD 2000»
    Mining IC test data to optimize VLSI testing
    13 years 8 months ago
    Mining IC test data to optimize VLSI testing
    Download  web.engr.oregonstate.edu
    We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
    Tony Fountain, Thomas G. Dietterich, Bill Sudyka
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