4 search results - page 1 / 1 » On the generation of pseudo-deterministic two-patterns test ... |
DATE
1997
IEEE
13 years 8 months ago
1997
IEEE
Many Built-In Self Test pattern generators use Linear Feedback Shift Registers (LFSR) to generate test sequences. In this paper, we address the generation of deterministic pairs o...
ITC
1996
IEEE
13 years 8 months ago
1996
IEEE
This paper presents a low-overhead scheme for built-in self-test of circuits with scan. Complete (100%) fault coverage is obtained without modifying the function logic and without...
DFT
2006
IEEE
13 years 10 months ago
2006
IEEE
This paper presents a procedure for Synthesis of LINear test pattern Generators called SLING. SLING can synthesize linear test pattern generators that satisfy constraints on area,...
FPT
2005
IEEE
13 years 10 months ago
2005
IEEE
This paper describes a class of FPGA-specific uniform random number generators with a 2k −1 length period, which can provide k random bits per-cycle for the cost of k Lookup Ta...