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DATE
2009
IEEE
77views Hardware» more  DATE 2009»
11 years 8 months ago
On the relationship between stuck-at fault coverage and transition fault coverage
The single stuck-at fault coverage is often seen as a figure-of-merit also for scan testing according to other fault models like transition faults, bridging faults, crosstalk faul...
Jan Schat
ICST
2008
IEEE
11 years 8 months ago
Relationships between Test Suites, Faults, and Fault Detection in GUI Testing
Software-testing researchers have long sought recipes for test suites that detect faults well. In the literature, empirical studies of testing techniques abound, yet the ideal tec...
Jaymie Strecker, Atif M. Memon
ITC
2003
IEEE
120views Hardware» more  ITC 2003»
11 years 7 months ago
High Quality ATPG for Delay Defects
: The paper presents a novel technique for generating effective vectors for delay defects. The test set achieves high path delay fault coverage to capture smalldistributed delay de...
Puneet Gupta, Michael S. Hsiao
MBEES
2008
11 years 3 months ago
Composition of Model-based Test Coverage Criteria
: In this paper, we discuss adjustable coverage criteria and their combinations in model-based testing. We formalize coverage criteria and specify test goals using OCL. Then, we pr...
Mario Friske, Bernd-Holger Schlingloff, Stephan We...
CASCON
1996
118views Education» more  CASCON 1996»
11 years 3 months ago
On predicting reliability of modules using code coverage
The estimation of reliability of modules using code coverage is motivated by a two-phase method for estimating the quality of software using static structure and predicted quality...
Saileshwar Krishnamurthy, Aditya P. Mathur
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