15 search results - page 2 / 3 » On the relationship between stuck-at fault coverage and tran... |
DATE
2008
IEEE
13 years 10 months ago
2008
IEEE
— Market and customer demands have continued to push the limits of CMOS performance. At-speed test has become a common method to ensure these high performance chips are being shi...
ESEM
2009
ACM
13 years 8 months ago
2009
ACM
Test coverage is a promising measure of test effectiveness and development organizations are interested in costeffective levels of coverage that provide sufficient fault removal w...
SIGSOFT
1998
ACM
13 years 8 months ago
1998
ACM
This paper reports on an empirical evaluation of the fault-detecting ability of two white-box software testing techniques: decision coverage (branch testing) and the all-uses data...
FORTE
2000
13 years 5 months ago
2000
The paper addresses the problem of test derivation from partially defined specifications. A specification is modeled by an Input/Output FSM such that transitions from some states ...
WWW
2007
ACM
14 years 5 months ago
2007
ACM
To increase confidence in the correctness of specified policies, policy developers can conduct policy testing by supplying typical test inputs (requests) and subsequently checking...