15 search results - page 3 / 3 » On the relationship between stuck-at fault coverage and tran... |
ISSRE
2006
IEEE
13 years 10 months ago
2006
IEEE
—Graphical user interfaces (GUIs) are used as front ends to most of today’s software applications. The event-driven nature of GUIs presents new challenges for testing. One impo...
EVOW
2008
Springer
13 years 6 months ago
2008
Springer
Traditional test generation methodologies for peripheral cores are performed by a skilled test engineer, leading to long generation times. In this paper a test generation methodolo...
ASPDAC
2006
ACM
13 years 10 months ago
2006
ACM
This paper presents a case-study of delay defect screening applied to Fujitsu 2.16GHz SPARC64 microprocessor. A nonrobust delay test is used while each test vector is compacted to...
KBSE
2000
IEEE
13 years 8 months ago
2000
IEEE
Testing has a vital support role in the software engineering process, but developing tests often takes significant resources. A formal specification is a repository of knowledge a...
KBSE
2007
IEEE
13 years 10 months ago
2007
IEEE
This paper describes a new automated technique to generate test cases for GUIs by using covering arrays (CAs). The key motivation is to generate long GUI event sequences that are ...