44 search results - page 1 / 9 » On the role of timing masking in reliable logic circuit desi... |
DAC
2008
ACM
14 years 5 months ago
2008
ACM
Soft errors, once only of concern in memories, are beginning to affect logic as well. Determining the soft error rate (SER) of a combinational circuit involves three main masking ...
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
There is a growing concern about timing errors resulting from design marginalities and the effects of circuit aging on speed-paths in logic circuits. This paper presents a low ove...
DAC
2004
ACM
14 years 5 months ago
2004
ACM
Programmable circuit design has played an important role in improving design productivity over the last few decades. By imposing structure on the design, efficient automation of s...
ISQED
2006
IEEE
13 years 10 months ago
2006
IEEE
This paper is concerned with statically analyzing the susceptibility of arbitrary combinational circuits to single event upsets that are becoming a significant concern for reliabi...
VLSID
2009
IEEE
14 years 5 months ago
2009
IEEE
We analyze the neutron induced soft error rate (SER). An induced error pulse is modeled by two parameters, probability of occurrence and probability density function of the pulse ...