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» On-Line Mapping of In-Field Defects in Image Sensor Arrays
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DFT
2006
IEEE
120views VLSI» more  DFT 2006»
13 years 9 months ago
On-Line Mapping of In-Field Defects in Image Sensor Arrays
Continued increase in complexity of digital image sensors means that defects are more likely to develop in the field, but little concrete information is available on in-field defe...
Jozsef Dudas, Cory Jung, Linda Wu, Glenn H. Chapma...
DFT
2007
IEEE
142views VLSI» more  DFT 2007»
13 years 10 months ago
Quantitative Analysis of In-Field Defects in Image Sensor Arrays
Growth of pixel density and sensor array size increases the likelihood of developing in-field pixel defects. An ongoing study on defect development in imagers has now provided us ...
Jenny Leung, Jozsef Dudas, Glenn H. Chapman, Israe...
DAC
2010
ACM
13 years 2 months ago
An error tolerance scheme for 3D CMOS imagers
A three-dimensional (3D) CMOS imager constructed by stacking a pixel array of backside illuminated sensors, an analog-to-digital converter (ADC) array, and an image signal process...
Hsiu-Ming Chang, Jiun-Lang Huang, Ding-Ming Kwai, ...