170 search results - page 1 / 34 » Online BIST for Embedded Systems |
DT
1998
13 years 4 months ago
1998
VLSID
2001
IEEE
14 years 5 months ago
2001
IEEE
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
INTEGRATION
1998
13 years 4 months ago
1998
An increasing part of microelectronic systems is implemented on the basis of predesigned and preverified modules, so-called cores, which are reused in many instances. Core-provide...
ICCD
2002
IEEE
14 years 2 months ago
2002
IEEE
Fault-tolerant distributed real-time systems are presently facing a lot of new challenges. Although many techniques provide effective masking of node failures on the architectural...
CSREAESA
2010
13 years 3 months ago
2010
The primary goal of Built-In Self-Test (BIST) for Field Programmable Gate Arrays (FPGAs) is to completely test all programmable logic and routing resources in the device such that ...