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HPCA
2008
IEEE
14 years 5 months ago
2008
IEEE
The continued scaling of device dimensions and the operating voltage reduces the critical charge and thus natural noise tolerance level of transistors. As a result, circuits can p...
JCP
2007
13 years 4 months ago
2007
— Following a toxic contaminant release, either accidental or intentional, predicting the transport and dispersion of the contaminant becomes a critical problem for Homeland Defe...
IROS
2009
IEEE
13 years 11 months ago
2009
IEEE
Abstract— Recently, classical pairwise Structure From Motion (SfM) techniques have been combined with non-linear global optimization (Bundle Adjustment, BA) over a sliding window...