6 search results - page 1 / 2 » Optimal periodic testing of intermittent faults in embedded ... |
DATE
2006
IEEE
13 years 11 months ago
2006
IEEE
Today’s nanometer technology trends have a very negative impact on the reliability of semiconductor products. Intermittent faults constitute the largest part of reliability fail...
ICDE
2007
IEEE
14 years 6 months ago
2007
IEEE
Current distributed database and stream processing systems assume that the network connecting nodes in the data processor is "always on," and that the absence of a netwo...
VTS
1997
IEEE
13 years 9 months ago
1997
IEEE
Accumulators based on addition or subtraction can be used as test pattern generators. Some circuits, however, require long test lengths if the parameters of the accumulator are no...
EATIS
2007
ACM
13 years 8 months ago
2007
ACM
This paper presents a new fault injection tool called Exhaustif (Exhaustive Workbench for Systems Reliability). Exhaustif is a SWIFI fault injection tool for fault tolerance verif...
RTSS
2003
IEEE
13 years 10 months ago
2003
IEEE
Dynamic voltage scaling (DVS) algorithms save energy by scaling down the processor frequency when the processor is not fully loaded. Many algorithms have been proposed for periodi...