4 search results - page 1 / 1 » Optimizing Test Length for Soft Faults in DRAM Devices |
VTS
2007
IEEE
13 years 10 months ago
2007
IEEE
: Soft faults in DRAMs are faults that do not get sensitized directly after an operation is performed, but require a time to pass before the fault can be detected. Tests developed ...
ISCA
2010
IEEE
13 years 8 months ago
2010
IEEE
Technology advancements have enabled the integration of large on-die embedded DRAM (eDRAM) caches. eDRAM is significantly denser than traditional SRAMs, but must be periodically r...
ISQED
2002
IEEE
13 years 9 months ago
2002
IEEE
The paper addresses the issue of microprocessor and microcontroller testing, and follows an approach based on the generation of a test program. The proposed method relies on two p...
SOCO
2010
Springer
12 years 11 months ago
2010
Springer
Until recently, local governments in Spain were using machines with rolling cylinders for verifying taximeters. However, the condition of the tires can lead to errors in the proces...