A panel session on the role of modeling and analysis in semiconductor manufacturing in a shrinking world is presented. Therefore, two participants are from Asia, two from Europe, ...
This paper is part of a focused paper panel discussion addressing the results of an invited workshop conducted in Orlando, Florida in February, 1997. The workshop addressed the qu...
—This paper discusses a vision problem for the detection of lift operation panel which is a plane subject to deformation due to viewing angle change. The key problem in this proj...
Han Wang, Y. Ying, V. P. Dinh, B. Y. Xie, Danwei W...
Abstract. GREC’05 marked the 10th anniversary of the series of international workshops on graphics recognition, for which the first edition was held in Penn State in 1995. At th...
- On April 23, 1993 a panel discussion was held at the IEEE International Conferenceon Data Engineering in Vienna, Austria, at which five membersof the data base researchcommunity ...
Michael Stonebraker, Rakesh Agrawal, Umeshwar Daya...