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» Parameterizations of Test Cover with Bounded Test Sizes
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ECCC
2010
106views more  ECCC 2010»
13 years 3 months ago
Hardness of Parameterized Resolution
Parameterized Resolution and, moreover, a general framework for parameterized proof complexity was introduced by Dantchev, Martin, and Szeider [16] (FOCS’07). In that paper, Dan...
Olaf Beyersdorff, Nicola Galesi, Massimo Lauria
ISSRE
2003
IEEE
13 years 10 months ago
Augmenting Simulated Annealing to Build Interaction Test Suites
Component based software development is prone to unexpected interaction faults. The goal is to test as many potential interactions as is feasible within time and budget constraint...
Myra B. Cohen, Charles J. Colbourn, Alan C. H. Lin...
VLSID
2006
IEEE
94views VLSI» more  VLSID 2006»
13 years 11 months ago
On the Size and Generation of Minimal N-Detection Tests
The main result of this paper, proved as a theorem, is that a lower bound on the number of test vectors that detect each fault at least N times is N
Kalyana R. Kantipudi
COMPSAC
2003
IEEE
13 years 10 months ago
Variable Strength Interaction Testing of Components
Complete interaction testing of components is too costly in all but the smallest systems. Yet component interactions are likely to cause unexpected faults. Recently, design of exp...
Myra B. Cohen, Peter B. Gibbons, Warwick B. Mugrid...