23 search results - page 1 / 5 » Partial scan delay fault testing of asynchronous circuits |
ICCAD
1997
IEEE
13 years 8 months ago
1997
IEEE
Asynchronous circuits operate correctly only under timing assumptions. Hence testing those circuits for delay faults is crucial. This paper describes a three-step method to detect...
VTS
1997
IEEE
13 years 8 months ago
1997
IEEE
We describe a technique to generate critical hazard-free tests for self-timed control circuits build using a macromodule library, in a partial scan based DFT environment. Wepropos...
IOLTS
2006
IEEE
13 years 10 months ago
2006
IEEE
— Delay failures are becoming a dominant failure mechanism in nanometer technologies. Diagnosis of such failures is important to ensure yield and robustness of the design. Howeve...
ICCAD
2002
IEEE
13 years 9 months ago
2002
IEEE
We study the undetectable faults in partial scan circuits under a test application scheme referred to as transparent-scan. The transparent-scan approach allows very aggressive tes...
DAC
2005
ACM
13 years 6 months ago
2005
ACM
1 This paper presents a transient faults sensitivity evaluation for Quasi Delay Insensitive (QDI) asynchronous circuits. Because of their specific architecture, asynchronous circui...