24 search results - page 5 / 5 » Patterns Reuse in the PASSI Methodology |
VLSID
2004
IEEE
14 years 5 months ago
2004
IEEE
As chip complexity grows, design productivity boost is expected from reuse of large parts and blocks of previous designs with the design effort largely invested into the new parts...
ISSS
1999
IEEE
13 years 9 months ago
1999
IEEE
In order to cope with the ever increasing complexity of todays application specific integrated circuits, a building block based design methodology is established. The system is co...
DAC
2002
ACM
14 years 5 months ago
2002
ACM
At-speed testing of high-speed circuits is becoming increasingly difficult with external testers due to the growing gap between design and tester performance, growing cost of high...
ICIA
2007
13 years 7 months ago
2007
We build the generic methodology based on machine learning and reasoning to detect the patterns of interaction between conflicting agents, including humans and their assistants. L...