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» Performance Prediction and Automated Tuning of Randomized an...
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DAC
2003
ACM
14 years 6 months ago
Death, taxes and failing chips
In the way they cope with variability, present-day methodologies are onerous, pessimistic and risky, all at the same time! Dealing with variability is an increasingly important as...
Chandu Visweswariah
DAC
2006
ACM
14 years 6 months ago
Criticality computation in parameterized statistical timing
Chips manufactured in 90 nm technology have shown large parametric variations, and a worsening trend is predicted. These parametric variations make circuit optimization difficult ...
Jinjun Xiong, Vladimir Zolotov, Natesan Venkateswa...
DAC
2008
ACM
14 years 6 months ago
Modeling of failure probability and statistical design of spin-torque transfer magnetic random access memory (STT MRAM) array fo
: Spin-Torque Transfer Magnetic RAM (STT MRAM) is a promising candidate for future universal memory. It combines the desirable attributes of current memory technologies such as SRA...
Jing Li, Charles Augustine, Sayeef S. Salahuddin, ...
DAC
2004
ACM
14 years 6 months ago
STAC: statistical timing analysis with correlation
Current technology trends have led to the growing impact of both inter-die and intra-die process variations on circuit performance. While it is imperative to model parameter varia...
Jiayong Le, Xin Li, Lawrence T. Pileggi
DAC
2008
ACM
14 years 6 months ago
Parameterized timing analysis with general delay models and arbitrary variation sources
Many recent techniques for timing analysis under variability, in which delay is an explicit function of underlying parameters, may be described as parameterized timing analysis. T...
Khaled R. Heloue, Farid N. Najm