315 search results - page 1 / 63 » Performance optimization under rise and fall parameters |
ICCAD
1999
IEEE
13 years 8 months ago
1999
IEEE
Typically,cell parameterssuch as the pin-to-pinintrinsicdelays, load-dependentcoe cients,andinputpin capacitanceshavedifferent values for rising and falling signals. The performan...
EUSFLAT
2009
13 years 2 months ago
2009
Abstract-- A portfolio model to minimize the risk of falling under uncertainty is discussed. The risk of falling is represented by the value-at-risk of rate of return. Introducing ...
ICCAD
2006
IEEE
14 years 1 months ago
2006
IEEE
Abstract— Design variability due to within-die and die-todie process variations has the potential to significantly reduce the maximum operating frequency and the effective yield...
DATE
2007
IEEE
13 years 10 months ago
2007
IEEE
Global interconnect temperature keeps rising in the current and future technologies due to self-heating and the adiabatic property of top metal layers. The thermal e ects impact a...
ETS
2010
IEEE
13 years 3 months ago
2010
IEEE
— A new method is presented to test dynamic parameters of Analogue-to-Digital Converters (ADC). A noisy and nonlinear pulse is applied as the test stimulus, which is suitable for...