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» Permutation test for periodicity in short time series data
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VLSID
2001
IEEE
164views VLSI» more  VLSID 2001»
14 years 5 months ago
An Efficient Parallel Transparent Bist Method For Multiple Embedded Memory Buffers
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
Der-Cheng Huang, Wen-Ben Jone, Sunil R. Das
SDM
2009
SIAM
170views Data Mining» more  SDM 2009»
14 years 2 months ago
Mining Complex Spatio-Temporal Sequence Patterns.
Mining sequential movement patterns describing group behaviour in potentially streaming spatio-temporal data sets is a challenging problem. Movements are typically noisy and often...
Florian Verhein
CONEXT
2008
ACM
13 years 7 months ago
Troubleshooting chronic conditions in large IP networks
Chronic network conditions are caused by performance impairing events that occur intermittently over an extended period of time. Such conditions can cause repeated performance deg...
Ajay Mahimkar, Jennifer Yates, Yin Zhang, Aman Sha...
ISF
2008
114views more  ISF 2008»
13 years 5 months ago
An OVAL-based active vulnerability assessment system for enterprise computer networks
Abstract Many security problems are caused by vulnerabilities hidden in enterprise computer networks. It is very important for system administrators to have knowledge about the sec...
Xiuzhen Chen, Qinghua Zheng, Xiaohong Guan
TIT
2002
96views more  TIT 2002»
13 years 4 months ago
Wavelet-based estimators of scaling behavior
Various wavelet-based estimators of self-similarity or long-range dependence scaling exponent are studied extensively. These estimators mainly include the (bi)orthogonal wavelet e...
Benjamin Audit, E. Bacry, J.-F. Muzy, Alain Arneod...