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» Perturbation-based Fault Screening
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HPCA
2007
IEEE
10 years 6 months ago
Perturbation-based Fault Screening
Fault screeners are a new breed of fault identification technique that can probabilistically detect if a transient fault has affected the state of a processor. We demonstrate that...
Paul Racunas, Kypros Constantinides, Srilatha Mann...
JCO
2008
85views more  JCO 2008»
9 years 11 months ago
Locating and detecting arrays for interaction faults
The identification of interaction faults in component-based systems has focussed on indicating the presence of faults, rather than their location and magnitude. While this is a va...
Charles J. Colbourn, Daniel W. McClary
ASPDAC
2006
ACM
155views Hardware» more  ASPDAC 2006»
10 years 5 months ago
Delay defect screening for a 2.16GHz SPARC64 microprocessor
This paper presents a case-study of delay defect screening applied to Fujitsu 2.16GHz SPARC64 microprocessor. A nonrobust delay test is used while each test vector is compacted to...
Noriyuki Ito, Akira Kanuma, Daisuke Maruyama, Hito...
DAC
2006
ACM
11 years 17 days ago
Timing-based delay test for screening small delay defects
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...
Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram
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