— A methodology is proposed for interdependent setup time and hold time characterization of sequential circuits. Integrating the methodology into an industrial sign-off static ti...
Emre Salman, Eby G. Friedman, Ali Dasdan, Feroze T...
With continued scaling of technology into nanometer regimes, the impact of coupling induced delay variations is significant. While several coupling-aware static timers have been pr...
Debasish Das, Kip Killpack, Chandramouli V. Kashya...
Statistical static timing analysis (SSTA) plays a key role in determining performance of the VLSI circuits implemented in state-of-the-art CMOS technology. A pre-requisite for emp...
—As process variations become a significant problem in deep sub-micron technology, a shift from deterministic static timing analysis to statistical static timing analysis for hig...
With the CMOS transistors being scaled to sub 45nm and lower, Negative Bias Temperature Instability (NBTI) has become a major concern due to its impact on PMOS transistor aging pr...