6 search results - page 1 / 2 » Post-silicon debugging for multi-core designs |
ATS
2010
IEEE
13 years 2 months ago
2010
IEEE
One of the most challenging problems in post-silicon validation is to identify those errors that cause prohibitive extra delay on speedpaths in the circuit under debug (CUD) and o...
FMCAD
2008
Springer
13 years 5 months ago
2008
Springer
Post-silicon debug is the problem of determining what's wrong when the fabricated chip of a new design behaves incorrectly. This problem now consumes over half of the overall ...
FPT
2005
IEEE
13 years 10 months ago
2005
IEEE
Producing a functionally correct integrated circuit is becoming increasingly difficult. No matter how careful a designer is, there will always be integrated circuits that are fabr...
DATE
2008
IEEE
13 years 10 months ago
2008
IEEE
When searching for functional bugs in silicon, debug data is acquired after a trigger event occurs. A trigger event can be configured at run-time using a set of control registers...
DAC
2009
ACM
14 years 5 months ago
2009
ACM
Post-silicon validation has become an essential step in the design flow of today's complex integrated circuits. One effective technique that provides real-time visibility to ...