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DATE
2006
IEEE
134views Hardware» more  DATE 2006»
11 years 11 months ago
Power constrained and defect-probability driven SoC test scheduling with test set partitioning
1 This paper presents a test scheduling approach for system-onchip production tests with peak-power constraints. An abort-onfirst-fail test approach is assumed, whereby the test is...
Zhiyuan He, Zebo Peng, Petru Eles
FPL
2004
Springer
98views Hardware» more  FPL 2004»
11 years 10 months ago
Power-Driven Design Partitioning
In order to enable efficient integration of FPGAs into cost effective and reliable high-performance systems as well potentially into low power mobile systems, their power efficienc...
Rajarshi Mukherjee, Seda Ogrenci Memik
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