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» ProB: an automated analysis toolset for the B method
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DAC
2002
ACM
14 years 6 months ago
Combined BEM/FEM substrate resistance modeling
For present-day micro-electronic designs, it is becoming ever more important to accurately model substrate coupling effects. Basically, either a Finite Element Method (FEM) or a B...
Eelco Schrik, N. P. van der Meijs
CAV
2000
Springer
197views Hardware» more  CAV 2000»
13 years 10 months ago
Bounded Model Construction for Monadic Second-Order Logics
Address: Abstraction, Composition, Symmetry, and a Little Deduction: The Remedies to State Explosion . . . . . . . . . . . . . . . . . . . . . . . . . . 1 A. Pnueli Invited Address...
Abdelwaheb Ayari, David A. Basin
BMCBI
2008
100views more  BMCBI 2008»
13 years 5 months ago
Hotspot Hunter: a computational system for large-scale screening and selection of candidate immunological hotspots in pathogen p
Background: T-cell epitopes that promiscuously bind to multiple alleles of a human leukocyte antigen (HLA) supertype are prime targets for development of vaccines and immunotherap...
Guanglan Zhang, Asif M. Khan, Kellathur N. Sriniva...
DAC
2008
ACM
14 years 6 months ago
Statistical modeling and simulation of threshold variation under dopant fluctuations and line-edge roughness
The threshold voltage (Vth) of a nanoscale transistor is severely affected by random dopant fluctuations and line-edge roughness. The analysis of these effects usually requires at...
Yun Ye, Frank Liu, Sani R. Nassif, Yu Cao
ISPD
2004
ACM
97views Hardware» more  ISPD 2004»
13 years 11 months ago
Implementation and extensibility of an analytic placer
Automated cell placement is a critical problem in VLSI physical design. New analytical placement methods that simultaneously spread cells and optimize wirelength have recently rec...
Andrew B. Kahng, Qinke Wang