15 search results - page 1 / 3 » Process variation aware thread mapping for Chip Multiprocess... |
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
Abstract—With the increasing scaling of manufacturing technology, process variation is a phenomenon that has become more prevalent. As a result, in the context of Chip Multiproce...
HIPEAC
2009
Springer
13 years 11 months ago
2009
Springer
Process variations, which lead to timing and power variations across identically-designed components, have been identified as one of the key future design challenges by the semico...
ISCA
2008
IEEE
13 years 11 months ago
2008
IEEE
Within-die process variation causes individual cores in a Chip Multiprocessor (CMP) to differ substantially in both static power consumed and maximum frequency supported. In this ...
FPL
2006
Springer
13 years 8 months ago
2006
Springer
Both custom IC and FPGA designs in the nanometer regime suffer from process variations. But different from custom ICs, FPGAs' programmability offers a unique design freedom t...
DAC
2009
ACM
14 years 5 months ago
2009
ACM
Within-die variation in leakage power consumption is substantial and increasing for chip-level multiprocessors (CMPs) and multiprocessor systems-on-chip. Dealing with this problem...