102 search results - page 1 / 21 » Pseudo-Exhaustive Testing of Sequential Circuits |
ITC
1989
IEEE
13 years 8 months ago
1989
IEEE
: The concept of a pseudo-exhaustive test for sequential circuits is introduced in a similar way as it is used for combinational networks. Instead of test sets one has to apply pse...
GLVLSI
1999
IEEE
13 years 8 months ago
1999
IEEE
ITC
1993
IEEE
13 years 8 months ago
1993
IEEE
ÐPseudoexhaustive testing of a combinational circuit involves applying all possible input patterns to all its individual output cones. The testing ensures detection of all detecta...
JISE
2000
13 years 4 months ago
2000
We present an algorithm for identifyinga set of faults that do not have to be targeted by a sequential delay fault test generator. These faults either cannot independently aect th...
ET
2000
13 years 4 months ago
2000
The paper presents a novel hierarchical approach to test pattern generation for sequential circuits based on an input model of mixed-level decision diagrams. A method that handles,...