4 search results - page 1 / 1 » RAMSES: A Fast Memory Fault Simulator |
DFT
1999
IEEE
13 years 8 months ago
1999
IEEE
In this paper, we present a memory fault simulator called the Random Access Memory Simulator for Error Screening (RAMSES). Although it was designed based on some wellknown memory ...
ICCAD
2000
IEEE
13 years 8 months ago
2000
IEEE
We present an error catch and analysis (ECA) system for semiconductor memories. The system consists of a test algorithm generator called TAGS, a fault simulator called RAMSES, and...
DATE
1998
IEEE
13 years 8 months ago
1998
IEEE
We extend the subsequence removal technique to provide signi cantly higher static compaction for sequential circuits. We show that state relaxation techniques can be used to ident...
EMSOFT
2009
Springer
13 years 11 months ago
2009
Springer
While NAND flash memories have rapidly increased in both capacity and performance and are increasingly used as a storage device in many embedded systems, their reliability has de...