7 search results - page 2 / 2 » RF Testing on a Mixed Signal Tester |
ICCD
2005
IEEE
14 years 2 months ago
2005
IEEE
The manufacturing test cost for mixed-signal SOCs is widely recognized to be much higher than that for digital SOCs. It has been shown in recent prior work that the use of analog ...
ETS
2006
IEEE
13 years 11 months ago
2006
IEEE
In this paper, complex mixed signal circuits such as SiP or SOC including several ADCs and DACs are considered. A new DFT technique is proposed allowing the test of this complete ...