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ICCD
2006
IEEE
116views Hardware» more  ICCD 2006»
12 years 10 months ago
RTL Scan Design for Skewed-Load At-speed Test under Power Constraints
This paper discusses an automated method to build scan chains at the register-transfer level (RTL) for powerconstrained at-speed testing. By analyzing a circuit at the RTL, where ...
Ho Fai Ko, Nicola Nicolici
ITC
2003
IEEE
138views Hardware» more  ITC 2003»
12 years 7 months ago
Efficient Scan Chain Design for Power Minimization During Scan Testing Under Routing Constraint
Scan-based architectures, though widely used in modern designs, are expensive in power consumption. In this paper, we present a new technique that allows to design power-optimized...
Yannick Bonhomme, Patrick Girard, Loïs Guille...
DAC
2005
ACM
12 years 3 months ago
Multi-frequency wrapper design and optimization for embedded cores under average power constraints
This paper presents a new method for designing test wrappers for embedded cores with multiple clock domains. By exploiting the use of multiple shift frequencies, the proposed meth...
Qiang Xu, Nicola Nicolici, Krishnendu Chakrabarty
ASPDAC
2006
ACM
90views Hardware» more  ASPDAC 2006»
12 years 7 months ago
A routability constrained scan chain ordering technique for test power reduction
Abstract— For scan-based testing, the high test power consumption may cause test power management problems, and the extra scan chain connections may cause routability degradation...
X.-L. Huang, J.-L. Huang
ASPDAC
2007
ACM
99views Hardware» more  ASPDAC 2007»
12 years 5 months ago
Shelf Packing to the Design and Optimization of A Power-Aware Multi-Frequency Wrapper Architecture for Modular IP Cores
Abstract-- This paper proposes a novel power-aware multifrequency wrapper architecture design to achieve at-speed testability. The trade-offs between power dissipation, scan time a...
Dan Zhao, Unni Chandran, Hideo Fujiwara
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