7 search results - page 1 / 2 » Random Adjacent Sequences: An Efficient Solution for Logic B... |
IFIP
2001
Springer
13 years 8 months ago
2001
Springer
: High defect coverage requires good coverage of different fault types. In this paper, we present a comprehensive test vector generation technique for BIST, called Random Single In...
VTS
2002
IEEE
13 years 9 months ago
2002
IEEE
High defect coverage requires good coverage of different fault types. In this paper, we present a comprehensive test vector generation technique for BIST, called Random Single Inp...
VLSID
2005
IEEE
13 years 10 months ago
2005
IEEE
During pseudorandom testing, a significant amount of energy and test application time is wasted for generating and for applying “useless” test vectors that do not contribute t...
ITC
1997
IEEE
13 years 8 months ago
1997
IEEE
This paper presents a new approach for designing test sequences to be generated on–chip. The proposed technique is based on machine learning, and provides a way to generate effi...
CORR
2010
Springer
13 years 1 months ago
2010
Springer
In the paper, an evolutionary approach to test generation for functional BIST is considered. The aim of the proposed scheme is to minimize the test data volume by allowing the dev...