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KDD
2000
ACM
211views Data Mining» more  KDD 2000»
13 years 8 months ago
Mining IC test data to optimize VLSI testing
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
Tony Fountain, Thomas G. Dietterich, Bill Sudyka
AAAI
2010
13 years 2 months ago
A Topic Model for Linked Documents and Update Rules for its Estimation
The latent topic model plays an important role in the unsupervised learning from a corpus, which provides a probabilistic interpretation of the corpus in terms of the latent topic...
Zhen Guo, Shenghuo Zhu, Zhongfei Zhang, Yun Chi, Y...
NIPS
2008
13 years 6 months ago
Natural Image Denoising with Convolutional Networks
We present an approach to low-level vision that combines two main ideas: the use of convolutional networks as an image processing architecture and an unsupervised learning procedu...
Viren Jain, H. Sebastian Seung