4 search results - page 1 / 1 » Rapid Generation of Thermal-Safe Test Schedules |
DATE
2005
IEEE
13 years 10 months ago
2005
IEEE
Overheating has been acknowledged as a major issue in testing complex SOCs. Several power constrained system-level DFT solutions (power constrained test scheduling) have recently ...
DATE
1999
IEEE
13 years 8 months ago
1999
IEEE
In this paper, new and efficient BIST methodology and BIST hardware insertion algorithms are presented for RTL data paths obtained from high level synthesis. The methodology is ba...
VLDB
1998
ACM
13 years 8 months ago
1998
ACM
Deterministic testing of SQL database systems is human intensive and cannot adequately cover the SQL input domain. A system (RAGS), was built to stochastically generate valid SQL ...
JSW
2007
13 years 4 months ago
2007
— Model-driven engineering (MDE) techniques are increasingly being used to address many of the development and operational lifecycle concerns of large-scale component-based syste...