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MICRO
2006
IEEE
159views Hardware» more  MICRO 2006»
11 years 5 months ago
MRF Reinforcer: A Probabilistic Element for Space Redundancy in Nanoscale Circuits
Shrinking devices to the nanoscale, increasing integration densities, and reducing of voltage levels down to the thermal limit, all conspire to produce faulty systems. Frequent oc...
Kundan Nepal, R. Iris Bahar, Joseph L. Mundy, Will...
ISCA
2005
IEEE
119views Hardware» more  ISCA 2005»
11 years 11 months ago
Rescue: A Microarchitecture for Testability and Defect Tolerance
Scaling feature size improves processor performance but increases each device’s susceptibility to defects (i.e., hard errors). As a result, fabrication technology must improve s...
Ethan Schuchman, T. N. Vijaykumar
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