7 search results - page 2 / 2 » Realistic Grammar Error Simulation using Markov Logic |
MICRO
2006
IEEE
13 years 5 months ago
2006
IEEE
Shrinking devices to the nanoscale, increasing integration densities, and reducing of voltage levels down to the thermal limit, all conspire to produce faulty systems. Frequent oc...
ISCA
2005
IEEE
13 years 10 months ago
2005
IEEE
Scaling feature size improves processor performance but increases each device’s susceptibility to defects (i.e., hard errors). As a result, fabrication technology must improve s...