33 search results - page 1 / 7 » Reconfiguration and Fine-Grained Redundancy for Fault Tolera... |
FPL
2006
Springer
13 years 8 months ago
2006
Springer
As manufacturing technology enters the ultra-deep submicron era, wafer yields are destined to drop due to higher occurrence of physical defects on the die. This paper proposes a y...
FPL
2005
Springer
13 years 10 months ago
2005
Springer
Future process nodes have such small feature sizes that there will be an increase in the number of manufacturing defects per die. For large FPGAs, it will be critical to tolerate ...
IJHPCA
2006
13 years 4 months ago
2006
Divide-and-conquer is a well-suited programming paradigm for parallel Grid applications. Our Satin system efficiently schedules the finegrained tasks of a divide-and-conquer appli...
FPL
2009
Springer
13 years 9 months ago
2009
Springer
Commercial SRAM-based FPGAs have the potential to provide aerospace applications with the necessary performance to meet next-generation mission requirements. However, the suscepti...
DDECS
2007
IEEE
13 years 10 months ago
2007
IEEE
— To increase the amount of logic available in SRAM-based FPGAs manufacturers are using nanometric technologies to boost logic density and reduce prices. However, nanometric scal...